- Jeol Jcm-5000 - $24,999.00 Jeol Jcm-5000 Neoscope Benchtop Sem, Without Software Omax Waterjet - $25,000.00 Omax Waterjet New Software And Rebuilt Pump Avenview Hdm-avxwall-4x12 - $24,874.00 Avenview Hdm-avxwall-4x12 4x12 4k Videowall Controller Wcontrolpro Software.
- At Lehigh University, we have been seeking a new state-of-the-art aberration-corrected analytical electron microscope (ACAEM) forimproved atomic-level analysis and enhanced low-voltage performance, funded by the NSF major research instrument (MRI) program.
- JEM-ARM200F STEM - read details of JEOL USA products in the SelectScience scientific laboratory products and suppliers directory News & Advice Clinical Drug Discovery. Product Guide Name: JEOL Ltd. OPERATION MANUAL for Basic TEM Overview. TITAN is a 300kV high resolution Transmission Electron Microscope (TEM).
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Skip to main contentSkip to navigationThe Jeol ARM200F. |
The Jeol ARM 200F is a world-class high-resolution (scanning) transmission electron microscope (S)TEM. The Warwick ARM 200F is aberration-corrected both in probe-forming optics (probe size FWHM <80 picometres) and in image-forming optics (image resolution <80 picometres). This allows atomic resolution imaging both in STEM and TEM modes, as shown in the examples (right).
The microscope has a Gatan Quantum electron energy loss spectrometer (EELS) to allow detection and quantification of the elemental composition down to the atomic level. Dual EELS allows both low-loss and core-loss regions of the spectrum to be collected simultaneously and a fast shutter allows data rates of up to 1000 spectra/second.
The microscope also currently has a 100mm2 Oxford Instruments windowless energy-dispersive X-ray (EDX) detector. This also yields composition maps with atomic resolution; both EDX and EELS spectra can be collected simultaneously at high data rates.
Specifications and Capabilities
|
Example images
| Atomic resolution STEM image of MoSe2–WSe2 lateral monolayer semiconductor heterojunctions.1 |
Atomic resolution TEM image using exit wave reconstruction (EWR) of graphene with overlaid ball and stick model.2 |
Relevant Publications
1 C. Huang et al.Nature Materials, 2014, 13, 1096
2 R.J. Kashtiban et al.Nature Comms, 2014, 5, 4902
LONDON, Feb. 19, 2014 /PRNewswire/ -- Reportbuyer.com just published a new market research report:
Jeol Arm200f Manual Artsy
Microscopy is a complex, high-technology market focused on producing enlarged images of very small objects. There is a perception that traditional light and electron microscopy will gradually be replaced by the newly emerging Atomic Force Microscopy (AFM) and Raman confocal systems, but traditional techniques will in reality continue to thrive as they contribute to a growing trend toward correlative microscopy in which multiple microscopy and/or spectroscopy techniques combine to investigate several integrated facets of a problem. Microscopy industry players face numerous challenges, including the complexity of the instrumentation and the technical support required to maintain customer bases, but the broad applicability of microscopy techniques and ongoing innovations continue to drive growth in the sector.
This TriMark Publications report describes major microscope market segments and includes examinations of light, confocal, electron, ion and scanning probe microscopes. It assesses the microscopy market drivers and bottlenecks from the perspective of the medical and scientific communities and discusses the potential benefits of the microscopy market for different sectors. The focus is on end-user markets, including hospitals, research facilities, freestanding clinics and equipment-leasing companies. This study also examines companies that are actively developing and marketing microscopy products around the world. The report includes current and forecasted market shares by company and profit/business opportunities by imaging segment.
TABLE OF CONTENTS
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1. Overview 12
1.1 Statement of Report 12
1.2 Scope of This Report 12
1.3 Objectives 13
1.4 Methodology 13
1.5 Aims of This Report 14
1.6 Executive Summary 15
2. Microscopy Technologies: An Overview 19
2.1 Basic Optical Microscopy 19
2.2 Electron Microscopy and Other Charged Particles Technologies 20
2.2.1 Advanced Optical Microscopy 21
2.2.1.1 Scanning Probe Microscopy 22
2.2.1.2 Fourier Transform Infrared Microscopy 22
2.2.1.3 Ultraviolet Microscopy 22
2.2.1.4 Scanning Acoustic Microscopy 23
2.2.1.5 X-Ray Microscopy/Microtomography (MCT, XMT, Micro-CT) 23
3. Optical Microscopy: An Overview 24
3.1 Basic Components of an Optical Microscope 25
3.1.1 Lens Systems 25
3.1.2 Resolution 26
3.1.3 Illumination Systems 26
3.2 Innovations 27
3.2.1 Stereo Microscope 27
3.3 Major Applications of Optical Microscopy 28
3.3.1 Applications in Semiconductor Industry 28
3.3.2 Automated Medical Imaging 29
3.4 Market Drivers for Automated Systems for Semiconductor and Medical
Applications 31
3.5 Real-Time Imaging 31
4. Fluorescence Microscopy: An Overview 32
4.1 Total Internal Reflection Fluorescence Microscopy 33
4.2 Multi-Photon Microscopy 33
4.2.1 Basic Principles 34
4.2.2 Lasers 34
4.2.3 Fluorophores for Multi-Photon Work 34
4.2.4 Uncaging 35
4.2.5 Antifluorescence 35
5. Laser Scanning Confocal Microscopy 36
5.1 Basic Principles 36
5.2 Photobleaching 37
5.3 High-Throughput Fluorescence and Confocal Imaging Systems 37
5.4 Optical, Fluorescence, Multi-Photon and Confocal Microscopes from Major
Vendors 38
5.4.1 Clinical and Cell Kinetics Microscope from Becton Dickinson (BD) 38
5.4.2 Optical Metrology Microscopes for Semiconductor Industry from KLA-Trencor
38
5.4.3 Korima, Inc.'s Protein Review Station 39
5.4.4 Leica Microsystems' Products 39
5.4.4.1 Upright Clinical and Fluorescence Microscopes 39
5.4.4.2 Leica's Inverted Clinical and Fluorescence Microscopes 40
5.4.4.3 Leica's Optical Microscopes for Education 40
5.4.4.4 Stereo- and Modular Microscopes for Quality Control, Routine Inspection,
Education and Research from Leica 40
5.4.4.5 Automated Research Microscopes from Leica 41
5.4.4.6 High-Precision Fluorescence Microscopes from Leica 41
5.4.4.7 Confocal Microscopes (Including Fluorescence and Multi-Photon
Capability) from Leica 42
5.4.4.8 Surgical Operating Microscopes from Leica 42
5.4.5 Nikon's Products 43
5.4.5.1 Nikon's Upright Microscopes Specialized for Life Sciences Research 43
5.4.5.2 Nikon's Upright Models Specialized for Industrial Applications 43
5.4.5.3 Nikon's Inverted Microscopes Specialized for Life Sciences Research 43
5.4.5.4 Inverted Microscopes Specialized for Industrial Applications from Nikon
44
5.4.5.5 Nikon's Stereomicroscopes 44
5.4.5.6 Nikon's Educational Microscopes 45
5.4.5.7 Nikon's Clinical and Research Microscopes 45
5.4.5.8 Nikon's Polarizing Microscopes 46
5.4.5.9 Nikon's Confocal Microscopes 46
5.4.5.10 Nikon's Measuring Microscopes (Including Confocal Capability) and
Industrial Microscopes 46
5.4.6 Olympus' Products 47
5.4.6.1 Olympus' Stereomicroscopes 47
5.4.6.2 Polarizing Microscopes from Olympus 48
5.4.6.3 Inverted Microscopes from Olympus 48
5.4.6.4 Olympus' Fluorescence Microscope for Biology 49
5.4.6.5 Confocal Microscopes for Biology from Olympus 49
5.4.7 Products from Veeco Instruments 49
5.4.7.1 White Light Interferometry (Optical Profiler) Microscopes from Veeco 49
5.4.8 Products from Carl Zeiss 50
5.4.8.1 Stereomicroscopes (Including Fluorescence Capability) from Carl Zeiss 50
5.4.8.2 Upright Microscopes from Carl Zeiss 50
5.4.8.3 Inverted Microscopes from Carl Zeiss 51
5.4.8.4 Polarizing Microscopes from Carl Zeiss 51
5.4.8.5 Confocal Microscopes (Including Fluorescence and Multi-Photon
Capabilities) from Carl Zeiss 51
5.4.9 Products from Visitron Systems GmbH 52
5.4.9.1 Modular Confocal Scanners from Visitron 52
6. Scanning Probe Microscopy: An Overview 53
6.1 Near-Field Scanning Optical Microscopy 53
6.1.1 Resonance Frequency 54
6.1.2 Aperture 54
6.1.3 Reflection Mode 54
6.2 Near-Field Scanning Thermal Microscopy 54
6.3 Atomic Force Microscopy 54
6.3.1 Semiconductor Applications 55
6.3.2 Magnetic Material Applications 55
6.3.3 Electrochemical Applications 55
6.3.4 Life Sciences Applications 55
6.4 Major Players and Products of AFM 56
6.4.1 Atomic Force Microscopes from Agilent Technologies 56
6.4.2 Atomic Force Microscopes from Asylum Research 57
6.4.3 Scanning Probe Microscopes from JEOL USA, Inc. 57
6.4.4 Atomic Force Metrology Tool for the Semiconductor Industry from KLA-Tencor
58
6.4.5 Scanning Probe Microscopes from Nanonics Imaging Ltd. 58
6.4.6 Surface Science Systems from Omicron NanoTechnology GmbH 59
6.4.7 Scanning Probe and AFM for Industry and the Life Sciences from Veeco 60
6.4.8 Automated AFM/AFP Systems for Metrology and Instrumentation 61
6.4.9 Combination Scanning Probe Microscopes from WITec Instruments Corp. 62
7. Infrared and Ultraviolet Microscopy: An Overview 63
7.1 Fourier-Transfer Infrared Microscopy (FT-IR) 63
7.2 Ultraviolet Microscopy 63
7.3 Infrared Microscopes for the Life Sciences from Bruker Optics 64
7.4 Multidisciplinary UV-Visible-NIR Microscopes and Modules from Craic
Technologies 64
7.5 UV Metrology Tools for the Semiconductor Industry from KLA-Tencor
Corporation 64
7.6 UV-Visible-NIR Microscopes for the Semiconductor Industry from Korima, Inc.
65
7.7 Infrared Microscopes from Thermo Scientific 66
7.8 Scanning Acoustic Microscopy, X-Ray Microtomography and Raman Spectroscopy
66
7.8.1 Scanning Acoustic Microscopy (SAM) 66
7.8.2 X-Ray Microtomography 67
7.8.3 Raman Spectroscopy Microscopy 68
7.8.4 Coherent Anti-Stokes Raman Scattering Microscopy 68
7.8.5 Scanning Acoustic Microscopes for Industrial Applications from Sonix, Inc.
69
7.8.6 Scanning Acoustic Systems for Industrial Applications from Sonoscan, Inc.
69
7.8.7 Tomographic Atom Probe for Semiconductors and Materials from Cameca 70
7.8.8 Microtomography for Industry, Research and the Life Sciences from SkyScan
70
7.8.9 Raman Microscopy from Bruker Optics 71
7.8.10 Raman Analytical Microscopes from Horiba Jobin Yvon 71
7.8.11 Raman Microscope from Renishaw 71
7.8.12 Raman Hybrid Microscopes from Renishaw 72
8. Electron Microscopes: An Overview 73
8.1 Transmission Electron Microscope (TEM) 73
8.1.1 Electron Source 74
8.2 Scanning Electron Microscope (SEM) 75
8.2.1 Rastering 75
8.2.2 Exploring the Sample 75
8.2.3 Types of Images 76
8.2.4 Environmental SEM and Variable Pressure SEM (VPSEM) 77
8.2.5 Low-Voltage Scanning Electron Microscopy 78
8.2.6 Tabletop Models 78
8.3 Applications 78
8.4 Scanning/Transmission Electron Microscope 78
8.5 Electron Probe Microanalyzer (Microprobe) 79
8.6 Auger Electron Microscopy/Spectroscopy (Auger) 80
8.7 Electron Beam (E-Beam) Lithography 80
8.8 Focused Ion Beam and Dual-Beam Microscope 80
8.9 Secondary Ion Mass Spectrometry (SIMS) 81
8.10 X-Ray Photoelectron Spectroscopy/Electron Spectroscopy for Chemical
Analysis 81
8.11 Scanning Helium Ion Beam Microscopy 82
8.12 Ancillary Analytical Attachments 82
8.12.1 Energy-Dispersive and Wavelength-Dispersive X-Ray Microanalyzers 83
8.12.2 Electron Backscatter Diffraction 83
8.12.3 Cathodoluminescence (CL) 83
8.12.4 X-Ray Microtomography 83
8.12.5 Raman Spectroscopy 83
8.13 Major Players and Products 84
8.13.1 Electron Probe Microanalyzer for Research from Cameca Instruments, Inc.
84
8.13.2 Secondary Ion Mass Spectrometry (SIMS) for Materials and Semiconductors
from Cameca 84
8.13.3 Magnetic Sector Secondary Ion Mass Spectrometry (SIMS) for Semiconductor
Technology 85
8.13.4 SIMS Microprobe for Materials, Semiconductors, Geology, Space Science and
Biology 85
8.13.5 Metrology SIMS for Semiconductors and Materials from Cameca 85
8.13.6 Metrology ULE SIMS for Semiconductors 86
8.13.7 TEM and SEM from FEI Company 86
8.13.8 SEM for Education, the Life Sciences, Materials Sciences, Semiconductor
and Data Storage Industries from FEI 88
8.13.9 Focused Ion Beam Microscopes for Materials Science and Industry from FEI
89
8.13.10 FIB/SEM Dual-Beam Systems for Electron Imaging with Ion and Electron
Milling from FEI 89
8.13.11 TEM and STEM for Industry, Materials Sciences and Life Sciences from
Hitachi 91
8.13.12 Scanning Electron Microscopes for Education, Industry, the Materials
Sciences and Life Sciences from Hitachi 92
8.13.13 Focused Ion Beam Microscopes from Hitachi 93
8.13.14 Dual Beam System from Hitachi 94
8.13.15 Metrology SEM from Hitachi 94
8.13.16 Defect-Review SEM from Hitachi 94
8.13.17 Transmission Electron Microscopes (Including STEM) from JEOL USA 95
8.13.18 Scanning Electron Microscopes from JEOL 96
8.13.19 Focused Ion Beam Microscope from JEOL 97
8.13.20 Dual-Beam Microscopes from JEOL 98
8.13.21 Traditional, ESCA and Auger Microprobes from JEOL 98
8.13.22 Electron Beam Lithography Systems from JEOL 99
8.13.23 Wafer Inspection Scanning Electron Microscopes from JEOL 99
8.13.24 Electron-Beam Metrology Tools for the Semiconductor Industry from
KLA-Tencor 100
8.13.25 Auger-Capable Scanning Electron Microscope from Omicron Nanotechnology
GmbH 100
8.13.26 Electron Spectroscopy for Chemical Analysis/X-Ray Photoelectron
Spectroscopy (ESCA/XPS) and Auger from Omicron 101
8.13.27 Independent Scanning Probe/SEM/STM/Auger Analytical Measurement System
for Industry from Omicron 101
8.13.28 In Situ SPM/SEM/SAM/FIB Systems from Omicron 102
8.13.29 Focused Ion/SEM Dual-Beam System from Omicron 102
8.13.30 Electron-Beam Lithography Systems from Vistec Lithography 102
8.13.31 Transmission Electron Microscopes (Including STEM) from Carl Zeiss 103
8.13.32 Scanning Electron Microscopes from Carl Zeiss 104
8.13.33 FIB/SEM Dual-Beam Systems from Carl Zeiss 105
8.13.34 Helium-Ion Microscope from Carl Zeiss 105
9. 2012 Microscopy Today Innovation Awards 106
9.1 Dimension FastScan AFM 106
9.2 Vion Plasma Focused Ion Beam 106
9.3 K2 Summit Direct Detection Camera 107
9.4 Leica SR GSD Super-Resolution Microscope System 108
9.5 Internal Pulse Generator for the X-Cite XLED1 108
9.6 SCALEVIEW Microscope Objectives 109
9.7 Multimodal Electrochemical Probe for In Situ TEM 110
9.8 ARROW Hyperspectral Imaging Video Camera R 110
9.9 3D-OMiTEM 111
9.10 Tousimis Touch Screen 931 with 'Stasis Software' 112
10. Microscopy Markets: An Introduction 113
10.1 Competition in Microscopy Markets 113
10.2 Barriers to Growth 113
10.3 Market Drivers 113
10.4 Purchasers' Perspectives 114
10.5 The Microscope Market Place 115
10.6 The Four Market Leaders 117
10.7 Global Market for Microscopes and Accessories 118
10.7.1 Global Market for Microscopes Excluding Accessories 119
10.7.2 Market for Accessories of Microscopes 120
10.8 Microscopy Market Share by Application 121
10.8.1 Market for Microscopes in Semiconductor Industry 122
10.8.2 Market for Microscopes in Life Sciences 123
10.8.3 Market for Microscopes in Material Sciences Industry 124
10.8.4 Microscopy Market in Nanotechnology Industry 125
10.9 Global Market for Optical Microscopes 127
10.9.1 U.S. Market for Light Microscopes 128
10.9.2 European Market for Optical Microscopes 129
10.9.3 Rest of the World Markets for Optical Microscopes 130
10.10 Market for Electron Microscopes 131
11. Selected Company Profiles 133
11.1 Applied Precision, Inc. 133
11.1.1 DeltaVision OMX 133
11.1.2 DeltaVision OMX with the Blaze SIM Module 133
11.1.3 DV Elite 134
11.1.4 PersonalDV 134
11.1.5 softWoRx Explorer 2.0 134
11.1.6 softWoRx Suite 2.0 136
11.2 Becton, Dickinson and Company 137
11.2.1 BD Pathway 855 137
11.3 Bruker Corporation 138
11.3.1 MultiMode 8 138
11.3.2 BioScope Catalyst 138
11.3.3 Dimension FastScan Bio 139
11.3.4 Innova Atomic Force Microscope 139
11.3.5 InSight-450 3DAFM 139
11.3.6 InSight 3DAFM 140
11.3.7 Dimension Icon 140
11.3.8 Dimension Edge 140
11.3.9 ContourGT-1 141
11.3.10 ContourGT InMotion 141
11.3.11 ContourGT K 141
11.3.12 ContourGT X 142
11.4 Buehler Ltd. 142
11.4.1 AbrasiMet 250 Abrasive Cutter 142
11.4.2 AbrasiMatic 300 Abrasive Cutter 143
11.4.3 Delta Manual Abrasive Cutter 143
11.4.4 Delta Orbital and Chop Action Cutter 144
11.4.5 IsoMet 1000 Precision Saw 144
11.4.6 IsoMet 4000 and 5000 Precision Saws 144
11.4.7 IsoMet Low Speed Saw 145
11.5 Carl Zeiss Microscopy, LLC 145
11.5.1 Light Microscopes 145
11.5.1.1 Axio Imager 2 for Biology 145
11.5.1.2 Axio Imager 2 for Materials 146
11.5.1.3 Axio Imager for Polarized Light Microscopy 146
11.5.1.4 Axio Imager Vario 146
11.5.1.5 Axio Observer for Biology 147
11.5.1.6 Axio Observer for Materials 147
11.5.1.7 Axio Examiner for Biology 147
11.5.1.8 Axio Scope A1 for Biology 148
11.5.1.9 Axio Scope A1 for Materials 148
11.5.1.10 Axio Vert A1 for Biology 148
11.5.1.11 Axio Lab A1 for Biology 149
11.5.1.12 Primo Vert 149
11.5.1.13 Primo Star 149
11.5.2 Laser Scanning Microscopes 150
11.5.2.1 LSM 710 ConfoCor 3 150
11.5.2.2 LSM 710 NLO and LSM 780 NLO 150
11.5.2.3 LSM 710 150
11.5.2.4 LSM 780 151
11.5.2.5 LSM 7 MP 151
11.5.2.6 LSM 700 Biology 151
11.5.3 X-Ray Microscopy 152
11.5.3.1 ZEISS Xradia 410 Versa 152
11.5.3.2 ZEISS Xradia 520 Versa 152
11.5.3.3 ZEISS Xradia 800 Ultra 152
11.5.4 Stereo and Zoom Microscopes 153
11.5.4.1 Axio Zoom V16 153
11.5.4.2 SteREO Discovery V20 153
11.5.4.3 SteREO Discovery V12 153
11.5.4.4 SteREO Discovery V8 154
11.5.4.5 Stemi 2000 154
11.5.4.6 Stemi DV4 154
11.5.4.7 SteREO Lumar V12 155
11.5.5 Superresolution Microscopy 155
11.5.5.1 ELYRA 155
11.5.6 Correlative Microscopy 155
11.5.6.1 Shuttle & Find 155
11.5.7 Scanning Electron Microscopes 156
11.5.7.1 EVO for MA 156
11.5.7.2 EVO LS 156
11.5.7.3 EVO HD for Materials 156
11.5.7.4 EVO HD LS 157
11.5.7.5 SIGMA 157
11.5.7.6 MERLIN 157
11.6 FEI Company 158
11.6.1 Scanning Electron Microscopes (SEM) 158
11.6.1.1 Magellan XHR 158
11.6.1.2 Verios 158
11.6.1.3 Nova NanoSEM 159
11.6.1.4 Quanta SEM 159
11.6.1.5 Inspect SEM 159
11.6.2 Transmission Electron Microscopes (TEM) 160
11.6.2.1 Titan S/TEM 160
11.6.2.2 Tecnai TEM 160
11.6.3 DualBeam Systems 160
11.6.3.1 Scios DualBeam 160
11.6.3.2 Helios NanoLab 660 161
11.6.4 Focused Ion Beam (FIB) Systems 161
11.6.4.1 V600 FIB 161
11.6.4.2 V600 CE 162
11.6.5 Light Microscopy 162
11.6.5.1 Intravital 2 Photon 162
11.6.5.2 FEI iMIC 162
11.7 Gatan, Inc. 163
11.7.1 Specimen Preparation Tools 163
11.7.1.1 Ilion II 163
11.7.1.2 Model 681 PIPS High Resolution Ion Beam Coater 164
11.7.1.3 Model 682 PECS 164
11.7.1.4 683 Met-Etch 164
11.7.1.5 PIPS II 164
11.8 Hitachi High-Technologies America, Inc. 165
11.8.1 TM3000 165
11.8.2 H-9500 300 kV TEM 165
11.8.3 HD-2700 Cs-Corrected FE-STEM 166
11.8.4 HF-3300 300 kV FE-TEM 166
11.8.5 HT7700 120 kV Compact-Digital Biological TEM 167
11.8.6 HT7710 120 kV BF/DF STEM 167
11.9 JEOL Ltd. 168
11.9.1 Transmission Electron Microscopes (TEM) 168
11.9.1.1 JEM-1000 168
11.9.1.2 JEM-3100F 168
11.9.1.3 JEM-3200FS 169
11.9.1.4 JEM-ARM200F 169
11.9.1.5 JEM-2200FS 169
11.9.1.6 JEM-2100F 170
11.9.1.7 JEM-2100 170
11.9.1.8 JEM-2800 170
11.9.1.9 JEM-1400Plus 171
11.9.1.10 JED-2300T 171
11.9.2 Scanning Electron Microscopes 171
11.9.2.1 JSM-7800F 171
11.9.2.2 JSM-7610F 172
11.9.2.3 JSM-7500F 172
11.9.2.4 JSM-7100F 172
11.9.2.5 JSM-6610 173
11.9.2.6 JSM-6510 173
11.9.2.7 JASM-6200 173
11.9.2.8 JSM-6010LA 173
11.9.2.9 JCM-6000 174
11.10 KLA-Tencor Corporation 174
11.10.1 Broadband Patterned Wafer Defect Inspection Systems 174
11.10.2 Narrowband Patterned Wafer Defect Inspectors 174
11.10.3 Electron Beam Wafer Inspection Systems 175
11.10.4 High-Sampling Patterned-Wafer Defect Inspection System 175
11.10.5 Macro Defect Inspection, Metrology and Review Cluster Tool 175
11.10.6 Wafer Edge Inspection and Metrology Systems 176
11.10.7 Macro Defect Inspection Systems for Patterned Wafers 176
11.10.8 Unpatterned Wafer Surface Inspection Systems 176
11.10.9 Reticle Defect Inspection Systems for IC Fab Applications 176
11.10.10 ICOS CI-T620 Component Inspector 177
11.10.11 ICOS CI-T120/CI-T130 177
11.10.12 ICOS CI-T120S/CI-T130S 177
11.10.13 ICOS CI-3050 178
11.10.14 ICOS WI-2xx0 178
11.10.15 ICOS WI-22xx Series 178
11.10.16 ICOS WI-2280 Series 178
11.10.17 e-Beam Wafer Defect Review and Classification System 179
11.10.18 Archer Series 179
11.10.19 SpectraShape Family 180
11.10.20 Aleris Family 180
11.10.21 SpectraFx 200 180
11.10.22 Surfscan Series 180
11.10.23 Therma-Probe Series 181
11.10.24 HRP-350 181
11.10.25 IPRO Series 181
11.10.26 CIRCL 182
11.10.27 VisEdge Family 182
11.11 Leica Microsystems 182
11.11.1 Leica TCS SP8 STED 183
11.11.2 Leica TCS SP8X 183
11.11.3 Leica TCS SP8 MP 183
11.11.4 Leica TCS SP8 CARS 184
11.11.5 Leica TCS SP8 SMD 184
11.11.6 Leica HCS A 184
11.11.7 Leica TCS SPE 184
11.11.8 Leica TCS LSI 185
11.11.9 Leica SD AF 185
11.11.10 Leica DCM 3D 185
11.11.11 Leica SR GSD 186
11.11.12 Leica DM2700 M 186
11.11.13 Leica DM2700 P 186
11.11.14 Leica DMshare 187
11.11.15 Leica DM1000 187
11.11.16 Leica DM1750 M 187
11.11.17 Leica DM4000 B LED 187
11.11.18 Leica DMD108 188
11.11.19 Leica DM IL LED 188
11.11.20 Leica DM1000 LED 188
11.11.21 Leica DM4000 M LED 189
11.11.22 Leica DM4500 P LED 189
11.11.23 Leica FS4000 LED 189
11.11.24 Leica DM2500 190
11.11.25 Leica DM2000 and DM2000 LED 190
11.11.26 Leica DMI4000 B 190
11.11.27 Leica DM8000 M 191
11.11.28 Leica DM12000 M 191
11.11.29 Leica SD AF 191
11.11.30 Leica MMAF 192
11.11.31 Leica DM16000 B 192
11.11.32 Leica DM6000 B 192
11.11.33 Leica MM AF NX 193
11.11.34 Leica Multiviews 193
11.11.35 Leica SFL7000 193
11.11.36 Leitz Optilux 194
11.11.37 Leica DM100 194
11.11.38 Leica DM300 194
11.11.39 Leica DM500 195
11.11.40 Leica DM750 195
11.11.41 Leica DCM 3D 195
11.11.42 Leica DM6000 M 196
11.11.43 Leica DM2500 MH 196
11.11.44 Leica DM2500 M 196
11.11.45 Leica DM750 M 197
11.11.46 Leica DM15000 M 197
11.11.47 Leica DM13000 M 197
11.11.48 Leica DM ILM 198
11.11.49 Leica DM750 P 198
11.11.50 Leica AF6000 Modular Systems 198
11.11.51 Leica AM6000 199
11.11.52 Leica DM13000 B 199
11.11.53 Leica DM5500 B 199
11.11.54 Leica-DM5000 B 200
11.11.55 Leica DM3000 and DM3000 LED 200
11.11.56 Leica FS CB 200
11.11.57 Leica FS C 201
11.11.58 Leica FS M 201
11.11.59 Leica M844 F40/F20 201
11.11.60 Leica M822 F40/F20 202
11.11.61 Leica M820 F40/F20 202
11.11.62 Leica M720 OH5 202
11.11.63 Leica M620 F20 203
11.11.64 Leica M525 F50 203
11.11.65 Leica M525 OH4 203
11.11.66 Leica M525 MS3 203
11.11.67 Leica M525 F40 204
11.11.68 Leica M651 MSD 204
11.11.69 Leica M525 F20 204
11.11.70 Leica M320 F12 205
11.11.71 Leica M220 F12 205
11.11.72 Leica M400 E 205
11.11.73 Leica ES2 206
11.11.74 Leica EZ4 206
11.11.75 Leica EZ4 HD 206
11.11.76 Leica S4 E 207
11.11.77 Leica S6 E 207
11.11.78 Leica DMS300 207
11.11.79 Leica DMS1000 208
11.11.80 Leica DMS1000 B 208
11.11.81 Leica DVM5000 HD 208
11.11.82 Leica DVM2500 208
11.12 Nanonics Imaging Ltd. 209
11.12.1 NSOPM and SPM Systems 209
11.12.1.1 Academia 209
11.12.1.2 MultiView 1000 209
11.12.1.3 MultiView 4000 210
11.12.1.4 Hydra Bio-SPM 210
11.12.1.5 Fountain Pen Nanolithography 210
11.12.1.6 Combined AFM FIB and AFM SEM 211
11.12.1.7 MultiView 2000 211
11.12.1.8 Optometronic 4000 211
11.12.1.9 CryoView 2000 212
11.12.1.10 CryoView 4000 SPM 212
11.12.2 Dual Optical Microscopes 212
11.12.2.1 Nanonics Confocal Microscope 212
11.12.2.2 Dual (Upright/Inverted) Microscope 213
11.13 Nikon Corporation 213
11.13.1 ECLIPSE Ni-E 213
11.13.2 ECLIPSE Ci-E 213
11.13.3 ECLIPSE E100 214
11.13.4 ECLIPSE FN1 214
11.13.5 ECLIPSE E200 214
11.13.6 ECLIPSE LV100N POL 215
11.13.7 ECLIPSE Ci-POL 215
11.13.8 ECLIPSE E200POL 215
11.13.9 ECLIPSE Ti 215
11.13.10 ECLIPSE TS100/100-F 216
11.13.11 NT-88-V3 216
11.13.12 Laser TIRF System 216
11.13.13 White-Light TIRF System 217
11.13.14 SMZ25/SMZ18 217
11.13.15 SMZ1000 217
11.13.16 SMZ800 218
11.13.17 SMZ745/745T 218
11.13.18 SMZ660 218
11.13.19 MULTIZOOM AZ100 219
11.13.20 MULTIZOOM AZ100M 219
11.13.21 ECLIPSE LV100ND POL/DS 219
11.13.22 ShuttlePix 220
11.13.23 N-SIM 220
11.13.24 N-STORM 220
11.13.25 A1+/A1R+ 221
11.13.26 C2+ 221
11.13.27 A1 MP+/A1R MP+ 221
11.13.28 AZ-C2+ 221
11.14 Olympus Corporation 222
11.14.1 Biological Confocal Laser Scanning Microscope FV 1200 222
11.14.2 FV1200MPE (Multiphoton Laser Scanning Microscope) 223
11.14.3 FLUOVIEW FV10i 223
11.14.4 BX63 223
11.14.5 BX53 224
11.14.6 BX46 224
11.14.7 BX43 224
11.14.8 CX41 225
11.14.9 CX31 225
11.14.10 CX22LED and CX22 225
11.14.11 BX51WI 225
11.14.12 BX53-P 226
11.14.13 CX31-P 226
11.14.14 FSX100 226
11.14.15 MVX10 226
11.14.16 CellSens 227
11.14.17 Total Internal Reflection Fluorescence Microscope (TIRFM) 227
11.14.18 IX83 227
11.14.19 IX73 228
11.14.20 IX53 228
11.14.21 CKX31 and CKX41 229
11.14.22 ON3 229
11.14.23 SZX16 229
11.14.24 SZX10 230
11.14.25 SZX7 230
11.14.26 SZ61 230
11.14.27 SZ51 231
11.15 Omicron NanoTechnology GmbH 231
11.15.1 Low Temperature SPM 231
11.15.1.1 LT STM 231
11.15.1.2 Cryogenic STM and SFM 232
11.15.2 Variable Temperature SPM 232
11.15.2.1 VT SPM 232
11.15.2.2 Femi SPM 233
11.15.3 Room Temperature SPM 233
11.15.3.1 UHV AFM/STM 233
11.15.3.2 UHV STM 1 233
11.15.4 Large Sample SPM 234
11.15.5 4 Probe SPM 234
11.15.5.1 UHV Nanoprobe 234
11.15.5.2 LT Nanoprobe 235
11.15.6 SPM Probe 235
11.16 WITec Wissenschaftliche Instrumente und Technologie GmbH 235
11.16.1 Alpha300 S 236
11.16.2 Alpha300 R 236
11.16.3 Alpha300A 236
11.17 Zao NT-MDT Company 237
11.17.1 NTEGRA Spectra 237
11.17.2 NTEGRA Spectrum 237
11.17.3 Bio AFM 237
11.17.4 NTEGRA Prima 238
11.17.5 NTEGRA Aura 238
11.17.6 NEXT 238
11.17.7 OPEN 239
11.17.8 SOLVER Nano 239
INDEX OF FIGURES
Figure 3.1: Basic Components of an Optical Microscope 24
Figure 3.2: Stereo Microscope 27
Figure 10.1: Microscopy Market Share by Leading Vendors 117
Figure 10.2: Global Market for Microscopes and Accessories, 2012-2019 119
Figure 10.3: Global Market for Microscopes Excluding Accessories, 2012-2019 120
Figure 10.4: Global Market for Accessories of Microscopes, 2012-2019 121
Figure 10.5: Microscopy Market Share by Application 122
Figure 10.6: Market for Microscopes in Semiconductor Industry, 2012-2019 123
Figure 10.7: Market for Microscopes in Life Sciences, 2012-2019 124
Figure 10.8: Market for Microscopes in Material Sciences Industry, 2012-2019 125
Figure 10.9: Market for Microscopes in Nanotechnology Industry, 2012-2019 126
Figure 10.10: Global Market for Optical Microscopes, 2012-2019 127
Figure 10.11: U.S. Market for Optical Microscopes, 2012-2019 128
Figure 10.12: European Market for Optical Microscopes, 2012-2019 129
Figure 10.13: Rest of the World Markets for Optical Microscopes, 2012-2019 130
Figure 10.14: Global Electron Microscope Market, 2012-2019 131
Manual Arts Senior High
INDEX OF TABLES
Manual Arts
Table 3.1: Basic Components of an Optical Microscope 24
Table 6.1: Types of Scanning Probe Microscopes 53
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